NanoWizard® 3 NanoOptics AFM systemイメージ/測定
Herpes Simplex Virus in buffer
Adsorbed onto silanized glass slide imaged in QI™ mode
最新製品情報
QI™ mode - 測定困難なサンプルを
簡便に測定するNanoWizard® 3 AFM シリーズ用定量イメージング
Atomic Force Microscopy
Specialized BioAFM solutions with true optical integration and highest resolution (afm, bioafm, bio afm, bio atomic force, atomic force microscopes, atomic force microscope, atomic force microscopy)
afm, bioafm, bio afm, bio atomic force, atomic force microscopes, atomic force microscope, atomic force microscopySpecialized BioAFM solutions with true optical integration and highest resolution
The QI™-Advanced option delivers parameters like adhesion, stiffness, dissipation and more while scanning
The QI™-Advanced software package is an extension of the standard QI™ version enabling quantitative measurement of nano-scale material properties such as stiffness, adhesion, dissipation and more.
The imaging data are quantitative with high spatial resolution.
- QI™-Advanced mode requires the NanoWizard® 3 AFM
- QI™ and QI™-Advanced are working with standard cantilevers
- Optional add-on to the standard QI™ software with more data channels and additional features for data extraction and processing
- Provides additionally adhesion, stiffness and dissipation data while scanning
- Depending on application, it can also deliver electrical conductivity or molecular recognition in a single scan
- Full datasets of force curves can be stored for post processing by the user