QI™ makes challenging samples easier to image

QI™, the new quantitative imaging mode from JPK, is developed to make AFM imaging easier than ever before.

With QI™- a force curve based imaging mode, the user has full control over the tip-sample interaction force at every pixel of the image. There is no longer a need for setpoint or gain adjustment while scanning anymore.

Quantitative Imaging – an entire force curve behind every pixel

Applying JPK’s ForceWatch™ technology, QI™ delivers outstanding results on challenging samples.

Problems with soft samples (hydrogels or biomolecules), sticky samples (polymers or bacteria), loosely attached samples (nanotubes or virus particles in fluid) or samples with steep edges (powders, MEMS structures) are removed.

• Any kind of sample can be imaged: samples with steep edges, loosely attached samples, soft, sticky and brittle samples
• Works under ambient conditions and in fluid
• Quick to learn and easy to operate
• No cantilever tuning needed like in cantilever oscillating modes
• No force setpoint adjustment while scanning due to JPK‘s ForceWatch™ technology
• Unattended imaging with user programmable patterns for multiple scans at different locations

QI™ comes with all AFMs of the new NanoWizard® 3 family as a standard:

• NanoWizard® 3 NanoOptics
• NanoWizard® 3 NanoScience
• NanoWizard® 3 BioScience