DirectOverlay™ 2 software module
Perfect optical integration enables direct correlation of AFM and optical data
- Perfect overlay of optical and AFM data with sub-diffraction limit precision
- Direct “in optical image” selection of AFM measurements (imaging and force curves)
- Dramatic reduction of overview image scanning in AFM, giving faster results & lower tip contamination
- Optical image navigation to specific regions of interest, even without AFM scanning. This protects functionalized tips for molecular recognition, avoids tip passivation from image scanning before the force measurements.