One system for all nano-force applications: The combined high-end solution for JPK Scanning Probe Microscopes and Optical Tweezers systems.
Where performance meets flexibility - benefit from the widest range of accessories in the market
Optical systems/accessories, electrochemistry solutions, electrical sample characterization, environmental control options, software modules, temperature control, acoustic and vibration isolation solutions and more. JPK provides you with the right accessories to control your sample conditions and to perform successful experiments.
- State-of-the-art digital controller with lowest noise levels.
- 4 high speed 16bit ADC channels with 60 MHz
- 12 ADCs with 18bit with 800 kHz
- State-of-the-art digital controller with lowest noise levels.
- High speed 16bit AD conversion with 60 MHz for the photodetector signals
- 24bit ultra precise ADC with 2.5 MHz
Powerful Optical Tweezers & AFM Combination for force measurements in 2D and 3D from 500fN to 10nN
Specialized sample stage for advanced experiments combining AFM and optical spectroscopy
The CellHesion® module combines the capabilities of the BioAFM with precise adhesion force measurements.
The single cell force testing solution for cell adhesion and elasticity studies.
Completely integrated system comprising upright optical microscope and AFM.
Free add-on for all JPK users: Create three-dimensional objects out of AFM images.
Remote control and monitoring of complex and long-term experiments.
For comprehensive planning of an experiment with all of the external parameters.
For advanced force measurement experiments from single protein unfolding, DNA stretching to probing of cells and tissue.
Perfect integration of optical and AFM data – JPK‘s proprietary and patented solution for perfect overlay of optical and AFM information.
Software module for NanoWizard® systems.
For visco-elastic properties of living cells and other samples such as gels or foams.
For highest resolution imaging of small structured samples in liquid.
The CoverslipHolder with electrical sample connection is designed for electrical measurements such as Conductive AFM or STM on a coverslip in combination with high NA optics.
Accommodates electrical conductive samples such as AFM metal stubs by magnetic fixation or transparent samples such as ITO coated glass coverslips.
Kelvin Probe (KPM) and Scanning Capacitance (SCM) Microscopy module. Option for nanoscale mapping of surface potential distribution.
For conductivity and I/V measurements on the nanoscale.
For experiments in inert atmosphere; for conductivity and I/V measurements on the nanoscale under controlled environmental conditions.
Tunneling Current Conductive AFM (TC-CAFM) module for low-conducting samples
The Scanning Tunnelling Microscopy (STM) module fits directly to the NanoWizard® head.
Can be used for biasing a sample, e.g., in electro-optical experiments or in Piezo-Response Force Microscopy (PFM).
JPK‘s ForceWheel™ handheld accessory for most sensitive experiment control, e.g., for force spectroscopy.
The Tuning Fork module fits directly to the NanoWizard® head and works with self excitation or external mechanical dither.
For sample property changes under external mechanical load up to 200N
Enables sample property changes under external mechanical load up to 5000N or 10000N
Automated mapping of sample properties over a large range for structured substrates, microspheres, cells. etc.
Offers automatic motion control for precise positioning of the sample relative to optical axis and AFM probe.
Offers sub-micron resolution & fine motion control for precise positioning of the AFM tip relative to optical axis and the sample.
Offers fine motion control for precise positioning of the AFM tip relative to the sample.
The holder can accommodate larger samples such as microchips or wafers and is equipped with spring clips which can be varied.
- Standard holder for all-round applications with a large optical field of view
- Supercut version for use in air or liquids with removable cantilever spring for maximum cleaning results.
This holder is designed for use in combination with inverted optical microscopes to observe the cantilever region from the side.
- Cantilever holder with electrical tip connection
- Magnetic field cantilever holder for magnetic actuation
Coverslip based fluid cell for Live Cell imaging and single molecule fluorescence with temperature control and perfusion
- closed liquid cell with standard coverslip bottom
- high-N.A. immersion optics possible
- for Live Cell imaging
- accomodates 35 mm Petri dishes even with glass bottom
The perfect solution for smallest volume experiments in a hermetically sealed environment, two versions available for volumes <150µl and <60µl.
Designed for polymer science and phase separation studies from ambient up to 300°C with a resolution of 0.1°C and minimized drift in all dimensions.
Designed for heating and cooling experiments in gas or liquids with minimized drift in all dimensions.
Designed for AFM experiments in air or liquids from 0°C up to 100°C with minimized drift in all dimensions – HCS™ follows the same design criteria as HTHS™.
JPK offers specialized cryostages together with NanoWizard® systems for cooling applications down to -120°C.
- works with transparent or non-transparent substrates
- temp. range from ambient to 60°C
- max. 1350µL liquid volume
Designed for electrochemistry AFM experiments with controlled heating and cooling of the sample.
JPK offers third party potentiostats for electrochemistry applications together with NanoWizard® systems.
from Accurion, Table Stable and TMC
Approved for high performance applications: acoustic hood from JPK for utmost stability and isolation, with temperature control option.
Approved for high performance applications: base frame with top plate from JPK for utmost stability.
Raman reflector kit for Tip-Enhanced Raman Scattering (upright-TERS) on opaque samples.
The Upright Fluorescence Microscope (UFM) Kit enables the combined use of AFM and upright fluorescence zoom microscopy.
The optical system for non transparent samples or substrates such as HOPG, mica, ceramics, metall etc.
The optical system for non transparent samples or substrates such as HOPG, mica, ceramics, implants etc. Can be used in combination with inverted microscopes.
The optical system for use with inverted optical microscopes or the JPK BioMAT™.
Allows the precise capture of light emitted by the SPM tip region into a fiber coupled detector for home-build SNOM or other light emitting tip experiments.
Adaptor for standard sample holder. Holds magnetically fixed AFM metal stubs.
For cantilever or sample fixation, easy removable and bio-compatible (2x 4ml).
from World Precision Instruments (WPI)
Cantilevers for standard contact and AC mode, high-resolution EBD tip cantilevers, chemically functionalized cantilevers, test grids, substrates and more
JPK supplies cameras from all major manufacturers, e.g., Andor® Technology, Jenoptik, The Imaging Source and IDS Imaging Development Systems.
Turnkey solution for environmental control of measurements with the JPK NanoWizard® AFM family