DirectOverlay™ software module
Perfect integration of optical and AFM data – JPK‘s proprietary and patented solution for perfect overlay of optical and AFM information.
- Perfect overlay of optical and AFM data with sub-diffraction limit precision
- Direct “in optical image” selection of AFM measurements (imaging and force curves)
- Dramatic reduction of overview image scanning in AFM, giving faster results & lower tip contamination
- Optical image navigation to specific regions of interest, even without AFM scanning. This protects functionalized tips for molecular recognition, avoiding tip passivation from image scanning before the force measurements.
See also the DirectOverlay™ page for more information.