Where performance meets flexibility - benefit from the widest range of accessories in the market

Optical systems/accessories, electrochemistry solutions, electrical sample characterization, environmental control options, software modules, temperature control, acoustic and vibration isolation solutions and more. JPK provides you with the right accessories to control your sample conditions and to perform successful experiments.

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StretchingStage

For sample property changes under external mechanical load up to 200N

StretchingStage for higher forces

Enables sample property changes under external mechanical load up to 5000N or 10000N

HybridStage™

Automated mapping of sample properties over a large range for structured substrates, microspheres, cells. etc.

Motorized precision stage

Offers automatic motion control for precise positioning of the sample relative to optical axis and AFM probe.

Head-up stage

For tall samples up to 140mm height

Standard stage

Offers fine motion control for precise positioning of the AFM tip relative to the sample.

Sample holder for large samples

The holder can accommodate larger samples such as microchips or wafers and is equipped with spring clips which can be varied.