Where performance meets flexibility - benefit from the widest range of accessories in the market

Optical systems/accessories, electrochemistry solutions, electrical sample characterization, environmental control options, software modules, temperature control, acoustic and vibration isolation solutions and more. JPK provides you with the right accessories to control your sample conditions and to perform successful experiments.


Vortis™ Combi controller

One system for all nano-force applications: The combined high-end solution for JPK Scanning Probe Microscopes and Optical Tweezers systems.

Vortis™ Advanced SPMControl station

  • State-of-the-art digital controller with lowest noise levels.
  • 4 high speed 16bit ADC channels with 60 MHz
  • 12 ADCs with 18bit with 800 kHz

Vortis™ SPMControl station

  • State-of-the-art digital controller with lowest noise levels.
  • High speed 16bit AD conversion with 60 MHz for the photodetector signals
  • 24bit ultra precise ADC with 2.5 MHz

TAO™ Tip Assisted Optics module

Specialized sample stage for advanced experiments combining AFM and optical spectroscopy

CellHesion® module

The CellHesion® module combines the capabilities of the BioAFM with precise adhesion force measurements.

CellHesion® 200 system option

The single cell force testing solution for cell adhesion and elasticity studies.

BioMaterials Workstation BioMAT™

Completely integrated system comprising upright optical microscope and AFM.


Remote control and monitoring of complex and long-term experiments.

QI™ Advanced mode

The QI™-Advanced option delivers parameters like adhesion, stiffness, dissipation and more while scanning.


For comprehensive planning of an experiment with all of the external parameters.

Advanced Force Spectroscopy module

For advanced force measurement experiments from single protein unfolding, DNA stretching to probing of cells and tissue.

DirectOverlay™ software module

Perfect integration of optical and AFM data – JPK‘s proprietary and patented solution for perfect overlay of optical and AFM information.

NanoLithography/NanoManipulation module

Software module for NanoWizard® systems.

MicroRheology software module

For visco-elastic properties of living cells and other samples such as gels or foams.

HyperDrive™ fluid imaging package

For highest resolution imaging of small structured samples in liquid.

CoverslipHolder with electrical sample connection

The CoverslipHolder with electrical sample connection is designed for electrical measurements such as Conductive AFM or STM on a coverslip in combination with high NA optics.

Electrical sample connection module

Accommodates electrical conductive samples such as AFM metal stubs by magnetic fixation or transparent samples such as ITO coated glass coverslips.

Kelvin Probe (KPM) and Scanning Capacitance (SCM) Microscopy module

Kelvin Probe (KPM) and Scanning Capacitance (SCM) Microscopy module. Option for nanoscale mapping of surface potential distribution.

Conductive AFM (CAFM) module

For conductivity and I/V measurements on the nanoscale.

Conductive AFM module - enclosed volume

For experiments in inert atmosphere; for conductivity and I/V measurements on the nanoscale under controlled environmental conditions.

TC-CAFM module

Tunneling Current Conductive AFM (TC-CAFM) module for low-conducting samples

Scanning Tunnelling Microscopy (STM) module

The Scanning Tunnelling Microscopy (STM) module fits directly to the NanoWizard® head.

High Voltage Sample Bias Amplifier

Can be used for biasing a sample, e.g., in electro-optical experiments or in Piezo-Response Force Microscopy (PFM).

Force Wheel

JPK‘s ForceWheel™ handheld accessory for most sensitive experiment control, e.g., for force spectroscopy.

Tuning Fork module

The Tuning Fork module fits directly to the NanoWizard® head and works with self excitation or external mechanical dither.


For sample property changes under external mechanical load up to 200N

StretchingStage for higher forces

Enables sample property changes under external mechanical load up to 5000N or 10000N


Automated mapping of sample properties over a large range for structured substrates, microspheres, cells. etc.

Motorized precision stage

Offers automatic motion control for precise positioning of the sample relative to optical axis and AFM probe.

Head-up stage

For tall samples up to 140mm height

Standard stage

Offers fine motion control for precise positioning of the AFM tip relative to the sample.

Sample holder for large samples

The holder can accommodate larger samples such as microchips or wafers and is equipped with spring clips which can be varied.


  • Standard holder for all-round applications with a large optical field of view
  • Supercut version for use in air or liquids with removable cantilever spring for maximum cleaning results.

Side-view cantilever holder

This holder is designed for use in combination with inverted optical microscopes to observe the cantilever region from the side.

Cantilever holders for electrical and magnetic experiments

  • Cantilever holder with electrical tip connection
  • Magnetic field cantilever holder for magnetic actuation

BioCell™ for AFM

Coverslip based fluid cell for Live Cell imaging and single molecule fluorescence with temperature control and perfusion


  • closed liquid cell with standard coverslip bottom
  • high-N.A. immersion optics possible
  • autoclavable


  • for Live Cell imaging
  • accomodates 35 mm Petri dishes even with glass bottom


The perfect solution for smallest volume experiments in a hermetically sealed environment, two versions available for volumes <150µl and <60µl.


Designed for polymer science and phase separation studies from ambient up to 300°C with a resolution of 0.1°C and minimized drift in all dimensions.

Heating Cooling Module - HCM™

Designed for heating and cooling experiments in gas or liquids with minimized drift in all dimensions.


Designed for AFM experiments in air or liquids from 0°C up to 100°C with minimized drift in all dimensions – HCS™ follows the same design criteria as HTHS™.


JPK offers specialized cryostages together with NanoWizard® systems for cooling applications down to -120°C.


  • works with transparent or non-transparent substrates
  • temp. range from ambient to 60°C
  • max. 1350µL liquid volume

HCS™ with electrochemistry cell

Designed for electrochemistry AFM experiments with controlled heating and cooling of the sample.

Potentiostats from IPS

JPK offers third party potentiostats for electrochemistry applications together with NanoWizard® systems.

JPK Acoustic Enclosure

Approved for high performance applications: acoustic hood from JPK for utmost stability and isolation, with temperature control option.

JPK base for acoustic enclosure

Approved for high performance applications: base frame with top plate from JPK for utmost stability.

Raman reflector kit

Raman reflector kit for Tip-Enhanced Raman Scattering (upright-TERS) on opaque samples.

Upright Fluorescence Microscope (UFM) Kit

The Upright Fluorescence Microscope (UFM) Kit enables the combined use of AFM and upright fluorescence zoom microscopy.


The optical system for non transparent samples or substrates such as HOPG, mica, ceramics, metall etc.

TopViewOptics™ for use with inverted optical microscopes

The optical system for use with inverted optical microscopes or the JPK BioMAT™.

Fiber coupled detection module

Allows the precise capture of light emitted by the SPM tip region into a fiber coupled detector for home-build SNOM or other light emitting tip experiments.

JPK sample holder for small samples

Adaptor for standard sample holder. Holds magnetically fixed AFM metal stubs.

JPK cable anchorage pillow

Heavy weight pillow for fixation of cables to reduce noise coupling.

JPK cantilever changing tool

Probe loading station for convenient cantilever exchange.

JPK bio-compatible glue

For cantilever or sample fixation, easy removable and bio-compatible (2x 4ml).

Fluidics Module

JPK FluidicsModule™ with up to 8 different liquids such as buffer solutions

Cantilever shop

Cantilevers for standard contact and AC mode, high-resolution EBD tip cantilevers, chemically functionalized cantilevers, test grids, substrates and more

Scanning Thermal Microscopy module - SThM

From Bruker Anasys, for thermal conductivity experiments