Specifications
- Atomic lattice resolution
- Tip-scanning stand-alone system, the only choice for simultaneous AFM and optics experiments
- Rigid low noise and liquid-safe design
- Low noise cantilever deflection detection system <15pm RMS
- Closed-loop for reproducible tip positioning and longtime position stability IR deflection detection light source with low coherence
- Transmission illumination with standard condensers for precise brightfield, DIC and phase contrast
- Intelligent and automated approach with user defined parameters for soft landing
- Scanner unit:
- Flexure stage scanner design with decoupled, low mass z scanner
- 100×100×15µm³ scan range for the head
Sense+ Controller
- State-of-the-art digital controller with lowest noise levels
- Passive cooling without a fan
- Front connectors for electrical modules and other accessories
New workflow-based V7 SPMControl software
- True multi-user platform, perfect for imaging facilities
- User-programmable software
- Fully automated sensitivity and spring-constant calibration using thermal noise or Sader method
- New DirectOverlay 2 option for combined optical and AFM information
- Improved ForceWatch™ and TipSaver™ mode for force spectroscopy and imaging
- Advanced spectroscopy modes such as various force clamp modes or ramp designs
- Powerful Data Processing (DP) with full functionality for data export, fitting, filtering, edge detection, 3D rendering, FFT, cross section, etc.
- Powerful batch processing of force curves and images including WLC, FJC, step-fitting, JKR, DMT model and other analyses
Stages and sample holders
- Stages are available for all major inverted optical microscope manufacturers
- Liquid-safe, robust and drift-minimized design
- Manual precision stage with 20×20mm2 travel range and independent positioning of tip and sample with respect to the optical axis
- Holders for Petri dishes, coverslips, microscope slides, metal SPM stubs, etc.
- Special holders and liquid cells possible
- Large Ø140×18mm3 free sample volume
Fluid cell options
- Inert glass standard cantilever holders for experiments in droplets or custom fluid cells
- Patented BioCell™ for high-NA immersion lenses and high-resolution AFM down to the single molecule level
- CoverslipHolder offers the same capability as the BioCell for ambient temperature experiments
- Temperature controlled electrochemistry cell ECCell™ with transmission illumination
- PetriDishHeater™, perfect for living cells
- SmallCell™ small volume version for aqueous solutions
Optical configurations
- Fits on inverted microscopes from
- Zeiss (Axio Observer, Axio Vert 100/200, Axio Vert A1)
- Olympus (IX line)
- Nikon (TE 2000, Ti/Ti2 line)
- and Leica (DMi line)
- Fully simultaneous operation with optical phase contrast and DIC using standard condensers
- Compatible with commercial confocal microscopes and fluorescence techniques such as TIRF, FRET, FCS, FRAP, FLIM, spinning disk, PALM, STORM, STED
- AFM and upright high-NA optics combination with the JPK BioMAT workstation (see BioMAT brochure)
- Large variety of high-end EM-CCD cameras supported
- TopViewOptics™ video optics for opaque samples
Temperature control options
- Ambient to 300°C temperature range with 0.1°C precision with the JPK High Temperature Heating Stage (HTHS™)
- -35°C to 120°C temperature range with 0.1°C precision with the JPK Heating Cooling Module (HCM™)
- -120°C up to 22°C with the JPK CryoStage
Options (see Accessories Handbook)
- Motorized precision stage with 20×20mm² travel range with joystick or software control
- Different sample holders, cantilever holders and stages for every application
- Stage-up kit for tall samples
- StretchingStage for AFM and samples under mechanical load
- Large choice of add-ons such as temperature controls and liquid cells even for aggressive solvents
- CellHesion® module with extra 100µm closed loop z range FluidFM® ADD-ON from Cytosurge
- Cameras and light sources for video imaging or fluorescence
- Vibration and acoustic isolation
Standard Operating Modes
Imaging modes
- Tapping™ Mode with PhaseImaging™
- Contact mode with lateral force microscopy (LFM)
Force spectroscopy (air or liquid)
- Static and dynamic spectroscopy
- Advanced Force Mapping
Optional Modes
- NEW PeakForce Tapping
- Higher harmonics imaging
- NEW Contact resonance AFM
- Conductive AFM
- Kelvin Probe Microscopy
- MFM and EFM
- STM
- Electrical spectroscopy modes
- Piezoresponse Microscopy
- Electrochemistry with temperature control and optical microscopy
- NanoLithography
- NanoManipulation
- Nanoindentation
- Scanning Thermal AFM
- NEW FluidFM solution from Cytosurge
- ExperimentPlanner™ for designing a specific measurement workflow
- RampDesigner™ for custom designed clamp and ramp experiments
- ExperimentControl™ feature for remote experiment control
- NEW DirectOverlay 2 for combined AFM and optical microscopy